VLSI Test Principles and Architectures

Chapter 7. Logic Diagnosis

Shi-Yu HuangNational Tsing Hua University, Hsinchu, Taiwan

About this Chapter

Given a logic circuit that fails a test, logic diagnosis is the process of narrowing down the possible locations of the defect. By reducing the candidate locations down to possibly only a few, subsequent physical failure analysis becomes much faster and easier when searching for the root causes of failure. For integrated circuit (IC) products, logic diagnosis is crucial in order to ramp up the manufacturing yield and in some cases to reduce the product debug time as well. This chapter begins by introducing the basic concepts of logic diagnosis. We then review the diagnosis techniques for combinational logic, scan chains, and logic built-in self-test ...