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Electronic Engineering and Information Science – Wang (Ed.)
© 2015 Taylor & Francis Group, London, ISBN: 978-1-138-02772-5
The design and research of wafer-type tester based on microprocessor
J.M. Feng, Y.J. Cao & H. Luo
College of Applied Science, Harbin University of Science and Technology, Harbin, China
ABSTRACT: In this paper, a wafer conductivity type tester based on, the microprocessor is designed and
produced, including parts of cold and hot probe temperature acquisition, thermal electromotive force acquisi-
tion, heating power control, microprocessor, input and output and so on. Temperature control is more stable and
accurate by PID algorithm. ...