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Electronic Engineering and Information Science – Wang (Ed.)
© 2015 Taylor & Francis Group, London, ISBN: 978-1-138-02772-5
MRC automatic measurement system of imaging device by FPGA
T.Z. Liu, W.J. Li, P.S. Zhao, D.Y. Yang & C. Wang
School of Electrical and Electronic Engineering, Harbin University of Science & Technology, Harbin, China
ABSTRACT: The evaluation method of photoelectric imaging device has been a research priority topic.
MRC is one of the important parameters which can evaluate the imaging device. The traditional MRC mea-
surement principle based on the subjective judgment of the human eye leads to the results which largely depend
on the person and it makes the evaluation uncertainty. This paper presents a method of automatic MRC ...