Model-Based Testing for Embedded Systems

418 Model-Based Testing for Embedded Systems

c

3

x

3

(k) + u(k) > = 0

c

3

x

3

(k) + u(k) < 0

v(k) = –1

x(k + 1) = Ax (k)+

bu(k) + a

v

(k) = +1

x(k + 1) = Ax (k)+

bu(k) – a

FIGURE 14.26

A hybrid automaton modeling the modulator.

Saturation zone

0.25

0.2

0.15

0.1

0.05

0

123456

N

78910

Sup x

1

(N)

FIGURE 14.27

Test generation result for the Delta–Sigma circuit. The computation time was less than 1 s.

14.14 Conclusion and Related Work

The main results presented in this chapter can be summarized as follows. We proposed

a formal framework for conformance testing of hybrid systems. This framework uses the

commonly accepted hybrid automaton model. We also proposed a novel coverage measure, ...