December 2017
Intermediate to advanced
688 pages
26h 53m
English
book
Model-Based Testing for Embedded Systems
by Justyna Zander, Ina Schieferdecker, Pieter J. Mosterman
Content preview from Model-Based Testing for Embedded Systems
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92 Model-Based Testing for Embedded Systems
reference nodes and edges of the state machine, respectively. It is initiated with the call
breadthF irstSearch(initialNode,s).
Both algorithms start at the initial pseudostate of the state machine depicted in
Figure 4.2. They traverse all outgoing transitions and keep on traversing until s has been vis-
ited. Here, we present the generated testing tree for breadth-first search in the toaster exam-
ple. We assume that the goal is to visit state S5. The testing tree is shown in Figure 4.14.
It contains only edges and nodes; events are not presented here.
Because of loops in transition sequences, the result
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