December 2017
Intermediate to advanced
688 pages
26h 53m
English
book
Model-Based Testing for Embedded Systems
by Justyna Zander, Ina Schieferdecker, Pieter J. Mosterman
Content preview from Model-Based Testing for Embedded Systems
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54 Model-Based Testing for Embedded Systems
• Data collection requirements. In addition to simple functional testing, the test framework
may also be called upon to gather data during a test run. This data may include the
response time of the SUT, analog signals to or from the SUT, or other data streams. You
will have to determine the data rates and the required precision of measurement. For very
large systems in which the test framework must be distributed, clock synchronization of
the test framework computers during data collection may become an important issue.
You may also have to reduce some of the collected data while a test is running, for
example, to determine pass/fail criteria for the test. If so, then supporting this data
reduction at run ...
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I'm always learning. So when I got on to O'Reilly, I was like a kid in a candy store. There are playlists. There are answers. There's on-demand training. It's worth its weight in gold, in terms of what it allows me to do.