Model-Based Testing for Embedded Systems

Model-Based X-in-the-Loop Testing 329

for software reuse are described in (Frakes and Terry 1996). Additional metrics specifically

concerning the reuse of test assets may have to be defined. There are ongoing studies that

use advanced approaches to assess the reusability of software components (Sharma, Grover,

and Kumar 2009). Such approaches could be adapted to suit the test domain.

While there is a significant body of work on quality assurance for standard

TTCN-3 (Bisanz 2006, Neukirchen, Zeiß, and Grabowski 2008, Neukirchen et al. 2008,

Zeiß 2006), quality assurance measures for TTCN-3 embedded remain to be studied, as

TTCN-3 embedded is still in the draft stage. Similar to standard TTCN-3, metrics, patterns,

code smells, guidelines, and refactorings ...