
274 Model-Based Testing for Embedded Systems
M¨aki-Asiala provides a set of guidelines for test case reuse in TTCN-3, discussing their
benefits for vertical reuse. The guidelines were designed for reusing tests with little effort
without considering test adapters so that interface visibility becomes a major issue (M¨aki-
Asiala 2005). Lehmann (2003) also addresses the interface visibility problem in his thesis,
highlighting the impossibility of test reuse for different test object interfaces. As mentioned
above, we address this problem by indirect observation, similar to Sch¨atz and Pfaller. Anal-
ogous to component-based design, we require functional ...