Model-Based Testing for Embedded Systems

430 Model-Based Testing for Embedded Systems

compare alternative choices of test stimuli on the fly. For each transition that is controllable

by the tester, a non-negative gain function is defined that depends on the current bindings of

the EFSM context variables. The gain function of a transition computes a value that depends

on the distance-weighted reachability of the unvisited traps from the given transition. The

gain guard of the tester controllable transition is true only when the transition is a prefix of

the test sequence with highest gain among those that depart from the current state. If gain

functions of several transitions evaluate to the same maximum value, the tester selects one

of these transitions either randomly or by the “least visited ...