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Model-Based Testing for Embedded Systems
book

Model-Based Testing for Embedded Systems

by Justyna Zander, Ina Schieferdecker, Pieter J. Mosterman
December 2017
Intermediate to advanced
688 pages
26h 53m
English
CRC Press
Content preview from Model-Based Testing for Embedded Systems
How to Design Extended Finite State Machine Test Models in Java 167
errors. To measure the error detection power of the generated tests, we wrote a software
simulation of a SIM chip in Java and used Jumble to generate 298 different mutants of that
simulation. Each mutant is like a potential bug in the SUT. Then, we generate different
size test suites and measure what percentage of the mutants/bugs is detected by the test
suite and what percentage of the lines of code in the SUT is executed by the test suite.
Figure 6.12 shows that the bug-detection rate rises rapidly up to a test length of 1000,
and then more slowly to the maximum of 85% of mutants
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Publisher Resources

ISBN: 9781439818473