December 2017
Intermediate to advanced
688 pages
26h 53m
English
book
Model-Based Testing for Embedded Systems
by Justyna Zander, Ina Schieferdecker, Pieter J. Mosterman
Content preview from Model-Based Testing for Embedded Systems
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Reactive Testing of Nondeterministic Systems 445
trap is reachable from the given shortest-path tree but does not know exactly how far
away the trap is.
• Max testing time before reset. This parameter defines the maximum testing time for a
situation where some of the traps have yet to be visited. In nondeterministic models,
restarting the IUT may increase the chance of visiting unvisited traps after reset.
• Max number of resets. This parameter defines the maximum number of IUT resets that
are performed in trying to cover traps that have yet to be covered.
• Continue running if max gain function value is zero. This parameter determines whether
the tester should continue running when the test goal is invisible or not.
• From transitions that have gain ...
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