Model-Based Testing for Embedded Systems

MBT of Analog Embedded Systems Components 611

10

−1

10

0

10

−2

10

1

Frequency

10

−1

10

0

Power |H(ω)|

2

10

−2

10

1

FIGURE 21.3

Shape of power spectrum in model-based exitation design for PLL test.

10

−1

10

0

ω

1

ω

2

ω

3

10

0

10

1

Relative power of excitation

10

−1

10

2

10

−2

10

1

Frequency ω/ω

n

FIGURE 21.4

Selection of power of each tone in multitone excitation for PLL test.

is designed that has power a

2

k

in each tone ω

k

that is proportional to 1/|H(ω

k

)|

2

(Figure 21.4). In order to test a DUT, the excitation x(t) is applied and the power spectrum

of the DUT’s output is measured at the frequencies ω

1

,...,ω

T

. If the model Equation 21.7

holds for the DUT, then power at frequencies ω

k

should all be ...