However, the back-to-back test is not capable of revealing this correlation since its
measurement does not distinguish between random and deterministic jitters. More-
over, the maximum precision of the back-to-back test is limited by the jitter perfor-
mance of the clock generator, which is often worse than 5 ps (in RMS values) by
itself. Therefore, it should be noted that the back-to-back frequency test is incapable
of accurately measuring the subpicosecond jitter error (i.e., less than 3 ps in RMS).
New test methods are needed to circumvent these limits and to facilitate accurate
subpicosecond jitt
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