
16 Semiconductors: Integrated Circuit Design for Manufacturability
1.7 This Book: Is/Is Not
The preceding discussion explained the need for DfM synthesis and this
book’s approach to the subject matter. Accordingly, we will follow the prod-
uct ow from architecture to the layout challenges and from DfM process
denition, through the manufacturing, to the metrics. We will discuss sev-
eral metrics to verify the efciency of DfM approaches in the design cycle,
TABLE1.3
Approaches to Hot Spot Elimination
Pros Cons Examples
Local repair Quick/simple and may be
sufcient
May cause domino effect
May not address root cause
Manual layout
changes
Reengineering ...