88 Semiconductors: Integrated Circuit Design for Manufacturability
20. LaRosa, G. NBTI challenges in PMOSFETs of advanced CMOS technologies.
IEEE International Reliability Physics Symposium, Tutorial Notes, 2003.
21. Methods for Calculating Failure Rates in Units of FITs, JESD85. JEDEC Publi-
cation. JEDEC Solid State Technology Association, Arlington, VA 2001.
22. Srinivasan, J., Adce, S. V., Bose, P., et al. The Case for Microarchitectural Awareness
of Lifetime Reliability. University of Illinois at Urbana Champaign, Computer
Science UIUC CS Technical Report, 2003.
23. Wu, H., Archer, V., Merchant, S., Cargo, J., Chesire, D., Antol, J., Mengel, R.,
Osenbach, J., Horvat, S., Peridier, C., and White, M. Advanced failure ...