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Semiconductors
book

Semiconductors

by Artur Balasinski
September 2018
Intermediate to advanced
248 pages
8h 19m
English
CRC Press
Content preview from Semiconductors
191
5
DfM Metrics
5.1 Introduction
To quantify the design for manufacturability (DfM) success rate, one needs
tangible metrics [1]. The cost and condence level of parameters to choose
from, including all aspects of reliability, yield, and cycle time, vary by orders
of magnitude. The simplest ones are design rule checks (DRCs): A mandatory
clean DRC report policy should ensure, at least theoretically, no fallouts until
the end of the specied product lifetime. Manufacturing yield verication is
hundreds of times more expensive and statistically less signicant, as it is not
possible to test every product for every aspect of its functio ...
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Publisher Resources

ISBN: 9781439817155