
Migrating Industrial DfM into IC Manufacturing 73
not as quantitative but also more cross dependent on die architecture and
product application. For this reason, we discuss yield aspects twice: in this
chapter, as a DfM deliverable, and in Chapter 5, as a DfM metric. Yield is a
dynamic deliverable, and to use it as a metric, one has to factor in its depen-
dence on testing conditions and time:
Yield
N Test t
N throughput
G
Total
=
( , )
( )
(2.17)
Parameter Description
N
G
Number of “good” (passing) dice according to testing criteria (Test) and time (t)
N
Total
Total number of dies depending on manufacturing throughput
Selection of (Test, t) depends now on ...