
ZnO Thin-Film and Nanowire-Based Sensor Applications 159
© 2011 by Taylor & Francis Group, LLC
AES depth proles of the Ti/Al/Pt/Au contact after annealing at 200°C showed that the initially
sharp interfaces between the different metals are degraded by reactions, especially between the Ti
and the ZnO to form Ti-O phases
29,30
and between the Pt and Al. We found that anneals at 600°C
almost completely intermixed the contact metallurgy. Low thermal stability of both ohmic and
Schottky contacts on ZnO appears to be a signicant problem in this materials system, and clearly
there is a need to investigate refractory metals with better thermal ...