Chapter 18
Process Capability
Abstract
Walter Shewhart said “the ultimate objective is not only to detect trouble, but also to find it, and such discovery naturally involves classification.” This chapter illustrates this principle in understanding how to detect the conformance of an equipment performance to the specifications.
Keywords
Statistical process control; Statistical quality control; Control charts; Process capability; Out of specification (OOS); Process capability index (Cp); One-sided and two-sided specifications (Cpk); Taguchi capability index (Cpkm)
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