498CHAPTER 17 Smart precursors for smart nanoparticles
17.10.7 SCANNING ELECTRON MICROSCOPY
This technique can provide information about surface features, morphology, compo-
sition, and the crystallographic information of the target sample. Accelerated beams
of electrons carry signicant amounts of kinetic energy, which is then dissipated into
a variety of signals of electron–sample interactions when the incident electrons are
deaccelerated in solid sample to generate a high resolution with shapes and phases,
along with a change in chemical compositions depending on the method of prepara-
tion. One disadvantage of the technique is that the surf ...
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