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Crystal Growth and Evaluation of Silicon for VLSI and ULSI
book

Crystal Growth and Evaluation of Silicon for VLSI and ULSI

by Golla Eranna
December 2014
Intermediate to advanced
430 pages
18h 9m
English
CRC Press
Content preview from Crystal Growth and Evaluation of Silicon for VLSI and ULSI
225
7
Resistivity and Impurity Concentration
Mapping of Silicon Wafers
7.1 Introduction
Dopant impurities play a key role in semiconductor device operation, as they directly
inuence the electrical properties of different regions. The dopant concentration
directly affects the parameters such as the threshold voltage in metal-oxide semicon-
ductor (MOS) very large scale integration (VLSI) transistors and breakdown voltage of
the devices fabricated. During silicon crystal growth, the impurity atoms with k
o
value
(i.e., equilibrium segregation coefcient) less than 1 are rejected by the advancing solid
at a greater rate than they can diffuse into the ...
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Publisher Resources

ISBN: 9781482232813