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Crystal Growth and Evaluation of Silicon for VLSI and ULSI
book

Crystal Growth and Evaluation of Silicon for VLSI and ULSI

by Golla Eranna
December 2014
Intermediate to advanced
430 pages
18h 9m
English
CRC Press
Content preview from Crystal Growth and Evaluation of Silicon for VLSI and ULSI
382 Crystal Growth and Evaluation of Silicon for VLSI and ULSI
packaging solution. High-performance, high I/O devices such as microprocessors and
peripheral logic use ip-chip mounting, not only for its superior electrical performance
and low parasitics, but also for its ability to enable pad-limited designs that cannot be wire
bonded. Fabrication facilities are being built around the world to produce a number of
different devices on 300mm wafers, including dynamic random access memory (DRAM),
logic, and microprocessors. These high-performance devices will be the rst products to
be bumped on 300 mm wafers. As the technology and availability of 300 mm processing
broadens, more cost-sensitive devices for consumer products will begin to be produ ...
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Publisher Resources

ISBN: 9781482232813