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Characterization in Silicon Processing
book

Characterization in Silicon Processing

by Yale Strausser
October 2013
Intermediate to advanced
240 pages
11h 53m
English
Newnes
Content preview from Characterization in Silicon Processing
CHARACTERIZATION
IN SILICON PROCESSING
EDITOR
Yale Strausser
CONSULTING
EDITORS
C. R Brundle
Gary E. McGuire
MANAGING
EDITOR
Lee E. Fitzpatrick
BUTTERWORTH-HEINEMANN
Boston London Oxford Singapore Sydney Toronto Wellington
MANNING
Greenwich
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Publisher Resources

ISBN: 9780080523422