Skip to Content
Characterization in Silicon Processing
book

Characterization in Silicon Processing

by Yale Strausser
October 2013
Intermediate to advanced
240 pages
11h 53m
English
Newnes
Content preview from Characterization in Silicon Processing
Figure
4.11
High-resolution
SEM of a
hillock formed
in an
aluminum
2%
silicon metal line
due to
post metal deposition heat
cycling.
Deposition
was at
room temperature
by
planar
magentron.
(as
is PECVD-deposited silicon nitride),
then
hillocks may form. The encapsulat-
ing film can also lead to void formation. A study
done
by Yost et al.12 indicates
that
the inherent stress in the metallization itself can lead to void formation over time
even without an encapsulating film. Hillocks have been defined earlier in this chap-
ter. Voids are simply the absence of metal in a particular area
(typically
along grain
boundaries and triple points).
Analytica ...
Become an O’Reilly member and get unlimited access to this title plus top books and audiobooks from O’Reilly and nearly 200 top publishers, thousands of courses curated by job role, 150+ live events each month,
and much more.

Read now

Unlock full access

More than 5,000 organizations count on O’Reilly

AirBnbBlueOriginElectronic ArtsHomeDepotNasdaqRakutenTata Consultancy Services

QuotationMarkO’Reilly covers everything we've got, with content to help us build a world-class technology community, upgrade the capabilities and competencies of our teams, and improve overall team performance as well as their engagement.
Julian F.
Head of Cybersecurity
QuotationMarkI wanted to learn C and C++, but it didn't click for me until I picked up an O'Reilly book. When I went on the O’Reilly platform, I was astonished to find all the books there, plus live events and sandboxes so you could play around with the technology.
Addison B.
Field Engineer
QuotationMarkI’ve been on the O’Reilly platform for more than eight years. I use a couple of learning platforms, but I'm on O'Reilly more than anybody else. When you're there, you start learning. I'm never disappointed.
Amir M.
Data Platform Tech Lead
QuotationMarkI'm always learning. So when I got on to O'Reilly, I was like a kid in a candy store. There are playlists. There are answers. There's on-demand training. It's worth its weight in gold, in terms of what it allows me to do.
Mark W.
Embedded Software Engineer

You might also like

Crystal Growth and Evaluation of Silicon for VLSI and ULSI

Crystal Growth and Evaluation of Silicon for VLSI and ULSI

Golla Eranna
Functionalization of Semiconductor Surfaces

Functionalization of Semiconductor Surfaces

Franklin Tao, Steven L. Bernasek
Silicon Photonics: Fundamentals and Devices

Silicon Photonics: Fundamentals and Devices

M. Jamal Deen, Prasanta Kumar Basu

Publisher Resources

ISBN: 9780080523422