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Characterization in Silicon Processing
book

Characterization in Silicon Processing

by Yale Strausser
October 2013
Intermediate to advanced
240 pages
11h 53m
English
Newnes
Content preview from Characterization in Silicon Processing
Raman
Spectroscopy*
17
Raman spectroscopy is the measurement, as a function of wavenumber, of the
inelastic
light scattering
that
results from the excitation of vibrations in molecular
and crystalline materials. The excitation source is a single line of a continuous gas
laser,
which permits optical microscope optics to be used for measurement of sam-
ples
down to a few mm. Raman spectroscopy is sensitive to molecular and crystal
structure; applications include chemical fingerprinting, examination of single
grains
in ceramics and rocks, single-crystal measurements, speciation of aqueous
solutions, identification of compounds in bubbles and flui ...
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Publisher Resources

ISBN: 9780080523422