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Characterization in Silicon Processing
book

Characterization in Silicon Processing

by Yale Strausser
October 2013
Intermediate to advanced
240 pages
11h 53m
English
Newnes
Content preview from Characterization in Silicon Processing
conditions. It is necessary to establish a relation between processing conditions and
barrier properties to arrive at a barrier with stable properties in VLSI devices. This
is
accomplished by characterizing the film at various stages of processing during
process development. Evaluation of the barrier properties of a film is carried out by
depositing the barrier and the overlayer metal films on unpatterned and patterned
silicon
wafers and heat-treating it to simulate the process conditions, followed by
analytical
examination. A variety of
analytical
tools are used to evaluate the chemi-
cal
composition, microstructure, and chemical stability
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Publisher Resources

ISBN: 9780080523422