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Characterization in Silicon Processing
book

Characterization in Silicon Processing

by Yale Strausser
October 2013
Intermediate to advanced
240 pages
11h 53m
English
Newnes
Content preview from Characterization in Silicon Processing
5
Tungsten-Based Conductors
ROC
BLUMENTHAL
and GREGORY C. SMITH
Contents
5.1 Applications for ULSI Processing
5.2 Deposition Principles
5.3 Blanket Tungsten Deposition
5.4 Selective Tungsten Deposition
5.1
Applications
for
ULSI Processing
Tungsten is used in integrated electronics as a high-conductivity interconnect met-
allization,
as a plug for vertical contacts and
vias
between metallization
layers,
or as
a
barrier between aluminum and silicon. Tungsten can be deposited by evaporation,
but sputtering and chemical vapor deposition (CVD) are the preferred techniques.
CVD films offer numerous advantages over sputtered films because of lower
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Publisher Resources

ISBN: 9780080523422