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Characterization in Silicon Processing
book

Characterization in Silicon Processing

by Yale Strausser
October 2013
Intermediate to advanced
240 pages
11h 53m
English
Newnes
Content preview from Characterization in Silicon Processing
Transmission Electron Microscopy
(TEM)*
28
In transmission electron microscopy (TEM) a thin solid specimen (< 200 nm
thick)
is bombarded in vacuum with a highly-focused, monoenergetic beam of
electrons.
The beam is of sufficient energy to propagate through the specimen. A
series
of
electromagnetic
lenses
then
magnifies this transmitted electron
signal.
Dif-
fracted electrons are observed in the form of a diffraction pattern beneath the
specimen.
This information is used to determine the atomic structure of the mate-
rial
in the sample. Transmitted electrons form images from small regions of sample
that
contain contrast, due to several scatterin ...
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Publisher Resources

ISBN: 9780080523422