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Characterization in Silicon Processing
book

Characterization in Silicon Processing

by Yale Strausser
October 2013
Intermediate to advanced
240 pages
11h 53m
English
Newnes
Content preview from Characterization in Silicon Processing
6
Barrier Films
M. LAWRENCE Α. DASS
Contents
6.1
Introduction
6.2 Characteristics of Barrier Films
6.3 Types of Barrier Films
6.4 Processing Barrier Films
6.5 Examples of Barrier Films
6.6 Summary
6.1
Introduction
Very
large scale integrated
(VLSI)
devices are made up of stacks of complex thin-
film
materials,
which need to be chemically inert and thermodynamically stable
both
during device processing and
throughout
device lifetime. In general, the
choice of
materials
is based on electrical properties for optimum device functioning
and
less
on their chemical compatibility. This results in heterojunctions with large
concentration gradients whic ...
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Publisher Resources

ISBN: 9780080523422