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Characterization in Silicon Processing
book

Characterization in Silicon Processing

by Yale Strausser
October 2013
Intermediate to advanced
240 pages
11h 53m
English
Newnes
Content preview from Characterization in Silicon Processing
Spreading Resistance Analysis (SRA) 24
ROGER
BRENNAN
and
DAVID
DICKEY
Spreading
resistance
analysis
(SRA) is a method of dopant profiling that
relies
on
the relationship between dopant concentration and electrical
resistivity
in semicon-
ductors. In SRA, the resistivity profile is determined from resistance measurements
made between two probes at a series of locations along a beveled surface of the
sample.
The method is used extensively on silicon, where it is
generally
an inexpen-
sive
way of obtaining a wealth of information. The accuracy for dopant concentra-
tions is generally in the 10-30% range; and that for depth is
typically
better tha ...
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Publisher Resources

ISBN: 9780080523422