
184 CHAPTER 5 Models for Power and Thermal Estimation
[80] K. Roy, S. Mukhopadhyay and H. Mahmoodi-Meimand, “Leakage current mechanisms and
leakage reduction techniques in deep-submicrometer CMOS circuits, ” Proceedings of the
IEEE , Vol. 91, No. 2, February 2003, pp. 305–327.
[81] C. Duvvury and A. Amerasekera , “ ESD: A pervasive reliability concern for IC technologies ,”
Proceedings of IEEE , Vol. 81 , May 1998 , pp. 690 – 702 .
[82] T. Green, “A review of EOS/ESD fi eld failures in military equipment, ” i n Proceedings of the
10th, EOS/ESD ...